EIA Standards Projects 

Below is the list and status of EIA Standards projects, organized by Committee, for the past 5 years. As part of the process of producing American National Standards, EIA standards are reviewed at least every 5 years and reaffirmed or revised. The EIA Standards Committee (ESC) strives for a balance of participants in each of its committees from three general categories; Users, Producers, and General Interest in the electronics and electrical industry. Participation is open to all directly and materially interested parties of matters addressed by the work. The three Categories are: User, Producer, and General Interest. Presently, ECIA is specifically seeking additional participation in the User and General Interest categories. This typically includes, but is not limited to, OEMs, ODMs, Contract Manufacturers, and Electronics Distributors (User Category), as well individuals who have expertise in these areas but are not affiliated with a particular company in the industry (General Interest Category).

Please direct any questions concerning the programs to:

 

American National Standards in Development

Published American National Standards

ANSI Standards Action (weekly list of standards open for public comment)

 

 

EIA Standards Project (2026-10-07)  

PASSIVES

 5533 National Adoption of 4 IEC documents

 5426 Review of IS-692 Ceramic Capacitor Qualification Specification

 5427 Revision of EIA-521-A Application Guide for Multilayer Ceramic Capacitors - Electrical

 5471 Revision of EIA-198-3-6-E Ceramic Dielectric Capacitors Classes I, II, III and IV Part III: Individual Specifications

 5512 Proposed Knowledge Base Article - Shelf life analysis of cover and carrier tape

 5513 Proposed Knowledge Base Article or Standard - Breakdown reusable reels

 5548 - New Standard - Multi-row tape

 5525 Rev of EIA-575-C Thick Film Resistor Specification

 5526 Rev of EIA-576-C

 5527 Revision of EIA-703-B

 5528 Revision of EIA-886-B Thick Film Resistor Array Specification

 5571 Revision of Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors

 5424 Update EIA-809 Solid Tantalum Capacitor Application Guideline

 5531 Review of EIA-944 Surface Mount Chip Bead Qualification Specification

 5477 Revision of EIA-977 Test Method – Electronic Passive Components Exposure to Atmospheric Sulfur"

  

New projects

Review of 481-F  4mm Through 200 mm Embossed Carrier Taping and 8 mm & 12 mm Punched Carrier Taping of Surface Mount Components for Automatic Handling

Fixed Resistors for Use in Electronic Equipment  Part 1: Generic Specification